TEL 2985-403464-W1引脚支架站 PDF资料
TEL 2985-403464-W1 是 Tokyo Electron(东京电子)半导体设备中的引脚支架站部件,属于晶圆探针台(Prober)的配套结构件。
特点
设备结构部件:属于 TEL 探针台设备的引脚支架站组件,用于支撑和固定测试引脚。
探针台配套:配合 TEL P-8 等晶圆探针台使用,服务于半导体器件的电气测试环节。
精密定位功能:用于精确定位测试引脚与晶圆焊盘之间的接触位置。
原厂部件号:以 TEL 标准部件号体系命名,属于设备维修替换件。
结构件属性:作为机械结构部件,不含电气控制功能。
参数
部件类型:引脚支架站(Pin Bracket Station)
部件号:2985-403464-W1
制造商:Tokyo Electron(TEL)
适用设备:TEL 晶圆探针台(Prober)系统
部件属性:精密机械结构件
应用领域
TEL 晶圆探针台引脚支撑与定位
半导体晶圆电气测试环节
探针台设备维修与部件替换
集成电路测试设备配套
半导体测试设备的精密结构组件
结尾说明:TEL 2985-403464-W1 为 Tokyo Electron 探针台设备的引脚支架站部件,属于精密机械结构件,适用于 TEL 探针台系统的维修与替换。
TEL 2985-403464-W1 is a pin holder station component in Tokyo Electron semiconductor equipment, which is a supporting structural component for wafer probe stations.
Characteristics
Equipment structural components: Pin bracket station components belonging to TEL probe station equipment, used to support and fix test pins.
Probe Station Matching: Used in conjunction with wafer probe stations such as TEL P-8, serving the electrical testing process of semiconductor devices.
Precision positioning function: used to accurately locate the contact position between test pins and wafer pads.
Original part number: Named according to the TEL standard part number system, it belongs to equipment maintenance replacement parts.
Structural component attribute: As a mechanical structural component, it does not include electrical control functions.
parameter
Component type: Pin Bracket Station
Part number: 2985-403464-W1
Manufacturer: Tokyo Electron (TEL)
Applicable equipment: TEL wafer probe station (Probe) system
Component attribute: Precision mechanical structural components
Application Areas
TEL wafer probe station pin support and positioning
Semiconductor wafer electrical testing process
Probe station equipment maintenance and component replacement
Integrated circuit testing equipment matching
Precision structural components of semiconductor testing equipment
Conclusion: TEL 2985-403464-W1 is a pin holder station component of Tokyo Electron probe station equipment, which belongs to precision mechanical structural components and is suitable for maintenance and replacement of TEL probe station systems.

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