KLA Tencor 710-661726-00过滤器模块 PDF资料
1.产 品 资 料 介 绍：
中文资料：
产品简介
型号：710-661726-00
类型：过滤器模块
功能：该模块主要用于半导体检测设备中的图像数据处理，承担随机缺陷过滤的功能，通过去除图像中的噪声和伪影，提高缺陷检测的准确性和可靠性。
应用领域
随机缺陷过滤
通过算法处理图像数据，过滤掉不必要的随机噪声，减少误报，提升检测精度。半导体检测设备
广泛应用于晶圆检测、图像处理和曝光对位设备中，确保设备高效、稳定运行。系统集成
与其他控制模块协同工作，实现设备整体的精准控制与管理。工业环境适应性
设计适应半导体洁净室环境，具备抗干扰和抗温度变化的能力，确保设备可靠运行。
总结
710-661726-00过滤器模块是KLA Tencor半导体检测系统中关键的图像噪声过滤组件，保障检测数据的精准性和设备的稳定性。
英文资料：
Product Introduction
Model: 710-661726-00
Type: Filter module
Function: This module is mainly used for image data processing in semiconductor detection equipment, undertaking the function of random defect filtering, and improving the accuracy and reliability of defect detection by removing noise and artifacts from images.
application area
Random defect filtering
By processing image data through algorithms, unnecessary random noise is filtered out, false positives are reduced, and detection accuracy is improved.
Semiconductor testing equipment
Widely used in wafer inspection, image processing, and exposure alignment equipment to ensure efficient and stable operation of the equipment.
system integration
Collaborate with other control modules to achieve precise control and management of the entire device.
Industrial environment adaptability
Designed to adapt to semiconductor cleanroom environments, with the ability to resist interference and temperature changes, ensuring reliable operation of equipment.
summarize
The 710-661726-00 filter module is a key image noise filtering component in the KLA Tencor semiconductor detection system, ensuring the accuracy of detection data and the stability of the equipment.
2.产 品 展 示
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| RCU500 | CACR-JU125ACAB | 61-0348-29D |
| RAIC400 | CACR-SR12-TZ6SF | EXP-M |
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| R8AFENA-R4-NS-NV-02 | R33HMNP-R2-NS-VS-00 | R33GEB0-R2-NS-VS-02 |
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